Structural and Electrical Characterization of Heterostructures Suitable for Future Nanoscale CMOS Devices

Files

gupea_2077_16394_1.pdf (1.03 MB)

Date

Authors

Myrberg, Tobias

URI

http://hdl.handle.net/2077/16394

Department

Physics and Engineering Physics
Fysik och teknisk fysik

Defence location

Hörsal KB Kemigården 4 Chalmers kl. 10.00

Collections

Doctoral Theses from University of Gothenburg / Doktorsavhandlingar från Göteborgs universitet